Fichas técnicas: productos para CMM

Busque documentos

• Leaflet: Instruction leaflet: ACR1 / ACR3 / FCR25 port replacement [en]
  

  Leaflet: Instruction leaflet: ACR1 / ACR3 / FCR25 port replacement

  Renishaw racks allow fast repeatable exchanging of probes and styli without the need for manual intervention. This leaflet covers the replacement of ports for ACR1, ACR3 and FCR25 racks.

  [584kB]
• Leaflet: ACR3 with powered port - power supply addendum [en]
  

  Leaflet: ACR3 with powered port - power supply addendum

  No description available

  [43kB]
• Data sheet: ACR3 autochange rack [en]
  

  Data sheet: ACR3 autochange rack

  No description available

  [416kB]
• Data sheet: AM2 adjustment module [en]
  

  Data sheet: AM2 adjustment module

  No description available

  [81kB]
• Leaflet: High speed communications cable wiring instructions [en]
  

  Leaflet: High speed communications cable wiring instructions

  Instruction leaflet outlining wiring the Renishaw orange high speed communications cable

  [164kB]
• Leaflet: Renishaw sensors for FARO's Quantum Arm [en]
  

  Leaflet: Renishaw sensors for FARO's Quantum Arm

  Leaftlet describing the benefits of the TP20 and the FARO SENSOR for use with a Quantum FARO portable arm

  [165kB]
• Leaflet: Repair leaflet: MCU E-STOP [en]
  

  Leaflet: Repair leaflet: MCU E-STOP

  Information leaflet outlining the procedure for repairing the MCU E-STOP

  [406kB]
• Leaflet: MCU docking plate [en]
  

  Leaflet: MCU docking plate

  No description available

  [113kB]
• Flyer: MH20 articulating probe head [en]
  

  Flyer: MH20 articulating probe head

  MH20 is a compact, infinitely adjustable manual probe head offering maximum flexibility in probe orientation. It can be installed on new and existing measuring machines via shank mounting, and is best suited to manual CMMs.

  [67kB]
• Data sheet: MH20 and MH20i [en]
  

  Data sheet: MH20 and MH20i

  MH20 and MH20i data sheet

  [1.3MB]
• Flyer: MH20i indexing probe head [en]
  

  Flyer: MH20i indexing probe head

  MH20i manual indexing probe head flyer

  [308kB]
• Leaflet: User's leaflet: MRS heavy duty legs [en]
  

  Leaflet: User's leaflet: MRS heavy duty legs

  Where an MRS installation has numerous SCP80s containing heavy stylus arrangements, or vertical stylus arrangements exceeding 190 mm, it is recommended that the optional MRS heavy duty leg kits are used to provide additional rigidity/height. These kits can be purchased separately to match the number of legs used on the MRS.

  [89kB]
• Leaflet: User's leaflet: MRS adjustable footplates [en]
  

  Leaflet: User's leaflet: MRS adjustable footplates

  The MRS rail can be placed at different heights from the CMM’s bed by using multiple MRS legs to provide the required clearance for long styli and extension bars. By using the optional MRS adjustable footplates shown below, the MRS rail can also be placed at different positions on the CMM’s bed thereby ensuring that a maximised working volume can be achieved.

  [56kB]
• Leaflet: MRS2 [en]
  

  Leaflet: MRS2

  No description available

  [64kB]
• Flyer: PH10 PLUS motorised probe head range [en]
  

  Flyer: PH10 PLUS motorised probe head range

  No description available

  [264kB]
• Flyer: PH10M-iQ PLUS [en]
  

  Flyer: PH10M-iQ PLUS

  PH10M-iQ PLUS – Less time calibrating, more time measuring

  [591kB]
• Hoja de datos técnicos: Cabezal de sonda motorizado PH20
  

  Hoja de datos técnicos: Cabezal de sonda motorizado PH20

  Cabezal de sonda motorizado PH20 triplica la producción de medición manteniendo una alta precisión del sistema.

  [270kB]
• Leaflet: PHC10-3 switch settings [en]
  

  Leaflet: PHC10-3 switch settings

  No description available

  [59kB]
• Leaflet: PHC10-3 card [en]
  

  Leaflet: PHC10-3 card

  Installation leaflet showing the installation of cards in to PHC10-3

  [845kB]
• Leaflet: RCP repair kit [en]
  

  Leaflet: RCP repair kit

  No description available

  [309kB]
• Leaflet: REVO head kit [en]
  

  Leaflet: REVO head kit

  No description available

  [173kB]
• Leaflet: REVO probe kits [en]
  

  Leaflet: REVO probe kits

  No description available

  [317kB]
• Flyer: REVO-2 and RSP2 probes [en]
  

  Flyer: REVO-2 and RSP2 probes

  REVO-2 is the only scanning system for CMMs that simultaneously controls the motion of three machine and two head axes whilst collecting work piece data using its range of 2D and 3D tactile probes, surface roughness measurement probe and now non-contact vision probe too.

  [351kB]
• Flyer: RFP1 fringe probe for REVO-2 [en]
  

  Flyer: RFP1 fringe probe for REVO-2

  The REVO® fringe probe (RFP1) is a non-contact structured light sensor for the REVO system offering highly accurate measurement of surface topology on an infinite positioning, 5-axis CMM platform.

  [278kB]
• Flyer: RSP3-1 to RSP3-4 probes for REVO-2 [en]
  

  Flyer: RSP3-1 to RSP3-4 probes for REVO-2

  The RSP3 range is used for 3-axis scanning with fixed REVO-2 head angles during measurement. Each probe is designed to provide optimised accuracy and contact force over a specified stylus range. Consequently, the RSH3 stylus holders are intended for use only with their respective RSP3 probe.

  [268kB]
• Flyer: RSP3-6 extended reach probe [en]
  

  Flyer: RSP3-6 extended reach probe

  The RSP3-6 provides enhanced capability for accessing deep bores and inspecting features within large parts. It is available with a range of stylus holders for applications requiring straight and cranked extensions and can be used for both touch-trigger and 2D scanning applications.

  [421kB]
• Flyer: RTP20 [en]
  

  Flyer: RTP20

  The RTP20 is a compact probe head with DCC capability and integral TP20 touch-trigger probe.

  [228kB]
• Flyer: RUP1 ultrasonic probe for REVO-2 [en]
  

  Flyer: RUP1 ultrasonic probe for REVO-2

  The RUP1 ultrasonic probe increases the multi-sensor capability of the REVO® 5-axis measurement system for CMMs, offering ultrasonic thickness inspection.

  [425kB]
• Flyer: RVP vision probe for REVO-2 [en]
  

  Flyer: RVP vision probe for REVO-2

  RVP further expands the range of applications for the REVO-2 system with a non-contact edge detecting sensor automatically interchangeable with all other REVO probe options. As a result, the system provides the optimum tool to measure multiple features, and a wider variety of parts can be inspected.

  [2.7MB]
• Flyer: ACM angle change mirror for RVP REVO vision probe [en]
  

  Flyer: ACM angle change mirror for RVP REVO vision probe

  No description available

  [700kB]
• Leaflet: SCP600 stylus change port [en]
  

  Leaflet: SCP600 stylus change port

  The stylus change port (SCP600) is a modular system, designed to allow automatic stylus changing on a CMMs, for the SP600 analogue probe.

  [148kB]
• Data sheet: SFM-A1 [en]
  

  Data sheet: SFM-A1

  Enhanced access and inspection capability for integrated surface finish measurement

  [175kB]
• Data sheet: SFM-A2 [en]
  

  Data sheet: SFM-A2

  Enhanced access and inspection capability for integrated surface finish measurement

  [197kB]
• Data sheet: SFM-B1 [en]
  

  Data sheet: SFM-B1

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-B2 [en]
  

  Data sheet: SFM-B2

  Enhanced access and inspection capability for integrated surface finish measurement.

  [204kB]
• Data sheet: SFM-B3 [en]
  

  Data sheet: SFM-B3

  Enhanced access and inspection capability for integrated surface finish measurement

  [166kB]
• Data sheet: SFM-B4 [en]
  

  Data sheet: SFM-B4

  Enhanced access and inspection capability for integrated surface finish measurement

  [200kB]
• Data sheet: SFM-B5 [en]
  

  Data sheet: SFM-B5

  Enhanced access and inspection capability for integrated surface finish measurement

  [187kB]
• Data sheet: SFM-C3 [en]
  

  Data sheet: SFM-C3

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-D1 [en]
  

  Data sheet: SFM-D1

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-E1 [en]
  

  Data sheet: SFM-E1

  Enhanced access and inspection capability for integrated surface finish measurement

  [160kB]
• Data sheet: SFM-E2 [en]
  

  Data sheet: SFM-E2

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-G1 [en]
  

  Data sheet: SFM-G1

  Enhanced access and inspection capability for integrated surface finish measurement

  [162kB]
• Data sheet: SFM-H1 [en]
  

  Data sheet: SFM-H1

  Enhanced access and inspection capability for integrated surface finish measurement

  [170kB]
• Flyer: SFP2 surface finish probe [en]
  

  Flyer: SFP2 surface finish probe

  The SFP2 probe increases the surface finish measurement ability of the REVO® system, which offers multi‑sensor capability providing touch-trigger, high speed tactile scanning and non‑contact vision measurement on a single CMM.

  [261kB]
• Flyer: Calibration and capability artefacts for SFP2 surface finish probe [en]
  

  Flyer: Calibration and capability artefacts for SFP2 surface finish probe

  Surface finish measurement has traditionally involved the use of hand-held sensors or has required the part to be moved onto a costly dedicated measuring machine. The SFP2 probe for the REVO® 5-axis system changes all this, making surface finish inspection an integral part of CMM measurement, enabling the automatic switching between scanning, optical non-contact and surface finish measurement probe types.

  [606kB]
• Leaflet: SH80K - for SP80 probes supplied before Oct 2007 [en]
  

  Leaflet: SH80K - for SP80 probes supplied before Oct 2007

  SH80K installation leaflet for SP80 probes supplied before Oct 2007

  [333kB]
• Folleto: Sistema de sonda de copiado SP25M
  

  Folleto: Sistema de sonda de copiado SP25M

  El sistema de sonda de copiado más compacto y versátil del mundo. H-1000-3155-03-A

  [115kB]
• Flyer: SP600Q in-quill scanning probe [en]
  

  Flyer: SP600Q in-quill scanning probe

  SP600Q in-quill scanning probe flyer

  [113kB]
• Flyer: SP80 ultra-high accuracy scanning probe [en]
  

  Flyer: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Data sheet: SP80 ultra-high accuracy scanning probe [en]
  

  Data sheet: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Leaflet: SPA2-2 / REVO E-STOP modification leaflet [en]
  

  Leaflet: SPA2-2 / REVO E-STOP modification leaflet

  No description available

  [1.3MB]
• Data sheet: TCR20 [en]
  

  Data sheet: TCR20

  TCR20 module change rack for PH20

  [417kB]
• Flyer: TP20 touch trigger probe system [en]
  

  Flyer: TP20 touch trigger probe system

  TP20 touch trigger probe system flyer

  [298kB]
• Folleto: TP200 - Sonda de activación por contacto de precisión
  

  Folleto: TP200 - Sonda de activación por contacto de precisión

  Sonda de activación por contacto de alta precisión con cambio de módulos de palpadores.

  [86kB]
• Data sheet: TP200 precision touch-trigger probe system with stylus changer [en]
  

  Data sheet: TP200 precision touch-trigger probe system with stylus changer

  No description available

  [194kB]
• Leaflet: Trigger force gauge guide [en]
  

  Leaflet: Trigger force gauge guide

  Trigger force is the amount of pressure applied by the helical compression spring onto the pivotal plate and bearing points to hold the stylus mount in place.

  [63kB]
• Leaflet: UCC daughtercards [en]
  

  Leaflet: UCC daughtercards

  No description available

  [54kB]
• Data sheet: Universal datum sphere [en]
  

  Data sheet: Universal datum sphere

  The Renishaw universal datum sphere enhances the performance of manual and fully automated co-ordinate measuring machines

  [323kB]
• Leaflet: Upgrade brackets and blanking plates [en]
  

  Leaflet: Upgrade brackets and blanking plates

  This leaflet details the bracket options available when upgrading or replacing Renishaw controllers and / or probe interfaces. By using a combination of the following brackets and / or blanking panels, any combination of existing and new Renishaw product can be mounted together inside a 19 inch cabinet rack. The bracket kits shown in this leaflet are supplied with all the necessary fixtures.

  [147kB]